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本文首次提出用统计法研究光电成像过程及各环节特性,建立了光电成像过程的统计极限探测方程,定量讨论了光电成像器件对这类图象的极限探测能力,并讨论了结果。
This paper presents for the first time the statistical method to study the electro-optical imaging process and the characteristics of each link. The statistical limit detection equation of the electro-optical imaging process is established. The limit detection capability of the photoelectric imaging device for such images is discussed quantitatively and the results are discussed.