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一、引言一般来说,对集成电路的测试按其不同的要求可分为以下二类: (1)分析测试。所谓分析测试是指在研制一个新的集成电路时所需进行的测试。这时往往在第一批样品出来以后需对其逻辑功能、参数指标、甚至一些物理性能等进行全面的考核,以便从中发现还存在的问题。就逻辑功能而言,这时就希望通过测试能准确地知道电路的故障所在,以便得知是逻辑设计上的问题还是某一道工序上的问题等等,从而可提出解决办法。所以这类测试对一些研究单位,工厂的
I. INTRODUCTION In general, the testing of integrated circuits can be divided into the following two categories according to their different requirements: (1) Analytical testing. The so-called analytical test refers to the development of a new integrated circuit required for testing. At this time, often after the first batch of samples came out, the logical functions, parameter indexes and even some physical properties should be thoroughly evaluated in order to find the remaining problems. In terms of logic functions, it is hoped that tests can accurately know the fault of the circuit so as to know whether it is a logic design problem, a process problem, and so on, so as to propose a solution. So this type of test on some research units, factories