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铜铬铟合金是目前研究的热门高强高导合金材料,具有优异的力学性能。本文利用电感耦合等离子体发射光谱法(ICP-OES)建立了铜铬铟合金中铟元素的测定方法,优化了仪器操作参数、考察了基体干扰情况,确定了230.606nm为分析谱线,用基体匹配法建立标准曲线。对铜铬铟合金进行了精密度和回收实验,相对标准偏差(RSD)为2.56%~3.87%,加标回收率在94%~104%之间。结果表明,该方法快速简捷,准确度高。
Copper-chromium indium alloy is currently the study of the popular high-strength high-conductivity alloy material, with excellent mechanical properties. In this paper, inductively coupled plasma atomic emission spectrometry (ICP-OES) was established for the determination of indium in copper-chromium-indium alloys. The operating parameters of the indium-chromium alloy were optimized. The interference of the matrix was investigated. The analytical line of 230.606 nm was determined. Matching method to establish a standard curve. The precision and recovery experiments of copper-chromium-indium alloy were studied. The relative standard deviations (RSDs) were 2.56% -3.87%, and the recovery rates were between 94% and 104%. The results show that the method is fast and simple and accurate.