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本文是关于故障诊断技术的文献综述,试图从方法发展的角度给出近年来此领域中遇到的新问题和由此产生的新方法。内容包括,门级电路的测试,高级模型;系统级诊断;故障模拟和硬件的易测设计。
This article is a literature review of fault diagnosis techniques, attempting to give the new problems encountered in this area in recent years and the new methods resulting from the perspective of method development. Including the door-level circuit testing, advanced models; system-level diagnosis; fault simulation and hardware design of the test.