论文部分内容阅读
提出了一种确定单层薄膜的光学常数和几何厚度的计算方法。通过讨论基于Fresnel的光学解析式,采用复合形法拟合分光光度计测得的反射率曲线,获得最优化的薄膜光学常数和厚度。然后采用此方法对理论模型薄膜加以验证,所得光学常数和厚度的最优解具有很好的一致性。此方法消除了单纯形法求解过程中存在的顶点退化问题,在整个优化求解过程中不需要初始值的输入,又由于考虑了约束条件,增加了显式和隐式方程约束,大大简化了计算和搜索范围,提高了收敛速度和计算精度。
A method to determine the optical constants and geometrical thicknesses of monolayer films is proposed. By discussing the optical resolution based on Fresnel, the reflectance curve of the spectrophotometer is fitted by the complex method to obtain the optimized optical constants and thicknesses of the films. Then, the theoretical model film is verified by this method. The obtained optimal optical constants and thickness have good agreement. This method eliminates the problem of vertex degeneration in solving the simplex method. It does not need to input the initial value in the entire optimization process, but also increases the constraints of explicit and implicit equations by considering the constraints, which greatly simplifies the calculation And search range, improve the convergence speed and accuracy.