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一、引 言 近年来,围绕着如何提高蓝宝石上的硅外延薄膜(SOS)的质量和降低其成本这两个主要目标,在成膜工艺和方法上,各国科技工作者都进行了大量的探索和研究,并且取得了一定的成就.影响蓝宝石上的外延硅薄膜结构和电学性质的重要因素之一是Al_2O_3衬底的自掺杂作用.而这种自掺杂无论是在外延的工艺过程中还是在随后的器件工艺中,都是有害的,并且随着温度的升高而加剧,因此,SOS的低温工艺是当前研究课题之
I. INTRODUCTION In recent years, around the two main goals of how to improve the quality of silicon epitaxial thin film (SOS) on sapphire and to reduce its cost, a lot of exploration and And some achievements have been made.One of the important factors affecting the structure and electrical properties of the epitaxial silicon thin film on sapphire is the self-doping effect of Al 2 O 3 substrate, which is not only in the epitaxial process, In subsequent device processes, both are detrimental and increase with increasing temperature, so the low-temperature process of SOS is the current research topic