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提出了一种提高功率晶体管稳态工作寿命试验可信度的技术措施，利用这一技术措施，可以在试验过程中实时测量并严格控制晶体管的结温达到最高允许结温，从而提高了试验的可信度。
A technical measure to improve the reliability of the power transistor steady-state working life test is proposed. By using this technical measure, the junction temperature of the transistor can be measured and controlled in real time during the test to reach the maximum allowable junction temperature, thereby improving the experimental Credibility.