,Magnetic Force Microscopy Study of Alternate Sputtered (001) Oriented L10 Phase FePt Films

• 作 者: XIA Ai-Lin CAO Jiang-Wei TONG Liu-Niu WEI Fu-Lin YANG Zheng HAN Bao-Shan
• 机 构: Anhui Key Laboratory of Metal Materials and Processing, School of Materials Science and Engineering,
• 出 处: 中国物理快报（英文版）
• 发表日期: 2007年1期

We present a magnetic force microscopy study of alteate sputtered (001) oriented L10 phase FePt films. It is found that the root-mean-square value of phase shift of magnetic force images, (△φ) can be used to char acterize the perpendicular anisotropy for a series of specimens. Therefore, the considerable improvement of the perpendicular anisotropy after post-annealing can be characterized.