近物所发射度扫描系统的最新改进(英文)

• 作 者: 曹云 Martin Stocki
• 机 构: SNS Oak Ridge National Laboratory USA.,
• 出 处: IMP & HIRFL Annual Report
• 发表日期: 2006年00期
• 关键词: Scanner scanner 扫描系统 multiply defects shielding 英文 charged roving enough

An Alison type Emittance Scanner System had been already developed in IMP and successfully used in the measurement of the emittance of multiply charged ion beams extracted from ECR ion source since 2003.Some good experimental results had been already obtained with the Emittance Scanner System.But the scanner system still had some defects,and its reliability also needed testing and improving.

An Alison type Emittance Scanner System had been developed in IMP and successfully used in the measurement of the emittance of multiply charged ion beams extracted from ECR ion source since 2003. Some good experimental results have been already obtained with the Emittance Scanner System. But the scanner system still had some defects, and its reliability needed research and improving.