,Isostructural phase transition-induced bulk modulus multiplication in dopant-stabilized ZrO2 solid

• 作 者: Min Wang Wen-Shu Shen Xiao-Dong Li Yan-Chun Li Guo-Zhao Zhang Cai-Long Liu Lin Zhao Shu-Peng Lv Chun-Xiao Gao Yong-Hao Han
• 机 构: State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012, China“,”Beijing Syn
• 出 处: 中国物理B（英文版）
• 发表日期: 2019年7期
• 关键词: high pressure x-ray diffraction crystal structure Y2O3/ZrO2

The electrical transport properties and structures of Y2O3/ZrO2 solid solution have been studied under high pressure up to 23.2 GPa by means of in situ impedance spectroscopy and x-ray diffraction (XRD) measurements. In the impedance spectra, it can be found that the pressure-dependent resistance of Y2O3/ZrO2 presents two different change trends before and after 13.3 GPa, but the crystal symmetry still remains stable in the cubic structure revealed by the XRD measurement and Rietveld refinement. The pressure dependence of the lattice constant and unit cell volume shows that the Y2O3/ZrO2 solid solution undergoes an isostructural phase transition at 13.1 GPa, which is responsible for the abnormal change in resistance. By fitting the volume data with the Birch–Muaghan equation of state, we found that the bulk modulus B0 of the Y2O3/ZrO2 solid solution increases by 131.9％from 125.2 GPa to 290.3 GPa due to the pressure-induced isostructural phase transition.