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当亚微米技术取得将数十万晶体管集成在一小块硅片上的辉徨成绩时,集成电路设计者可以不太费力地把传统中相当于一个系统的电路,例如从处理器一直到总线接口的电路,都设计在一块小小的芯片上,这就是所谓“芯片系统(The system-on-a-chip)”。对于这种芯片系统进行测试,显然是一个相当复杂的任务。分析表明,传统的方法对很多问题是无能为力的。这不仅在于这种芯片上具有的极大量电路和芯片少量插脚之间的矛盾,使测试无法全面控制、观察所有需要测试的电路节点,而且传统测试所采用的低于工作速度的测试方式,也已不再适应这种电路的实际需要。
When sub-micron technology to get the glory of hundreds of thousands of transistors integrated in a small piece of silicon, integrated circuit designers can not be too traditional to the equivalent of a system of circuits, such as the processor from the bus Interface circuit, are designed on a small chip, which is the so-called “chip system (The system-on-a-chip).” Testing this chip system is clearly a fairly complex task. Analysis shows that traditional methods are powerless to many problems. This is not only due to the conflict between the extremely large number of circuits on the chip and the small number of pins on the chip, so that the test can not be fully controlled and all the circuit nodes that need to be tested are observed. Moreover, the test methods below the working speed used in the conventional test No longer meet the actual needs of this circuit.