Effect of Yb substitution on microstructure and properties of Y1-xYbxBCO films

• 作 者: ShuaiYe[1]JunSong[2]MinLiu[3]LinMa[3]HongliSuo[3]JunleQu[2]
• 机 构: Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province
• 出 处: 第十三届全国超导学术研讨会
• 发表日期: 2015年期

　　Thin Y1-xYbxBCO films on LaAlO3 (LAO) (001) substrates were prepared by low-fluorine metal organic deposition (MOD) in order to investigate the effect of Yb substitution on the microstructure and the physical properties.Single-phase, c-axial-aligned Y1-xYbxBCO films were obtained, without any trace of YBCO and YbBCO phases.The variation of texture and morphology was studied as a function of the Yb content in these Y1-xYbxBCO films.The Yb substitution had only a slight effect on the critical temperature (Tc)of Y1-xYbxBCO films, but it had a strong effect on the in-field critical current density (Jc)values.As compared to pure YBCO films, the Jc values of the Y1-xYbxBCO films decreased at low fields (<0.5 T) but increased significantly at high fields.