Growth and atomic-scale characterization of graphene and graphene-h-BN hybrid on metal substrates

• 作 者: Yanfeng Zhang
• 机 构: DepartmentofMaterialsScienceandEngineering,CollegeofEngineering;PekingUniversity,Beijing,China
• 出 处: 无机非金属材料高层论坛暨第7届无机非金属材料专题——先进电子材料研讨会
• 发表日期: 2015年8期

Under different growth conditions and over different metal substrates of single and polycrystalline, the thickness, stacking geometry and growth mechanism of graphene should be dramatically modified.Scanning tunneling microscope(STM) should be a very powerful technique for addressing such issues.