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Structural and electrical properties of Al2O3/LaAlO3/Al2O3 films deposited using various tunnel oxid
【机 构】
:
Deparment of Materials Science and Engineering,Yonsei University,Seoul 120749,Korea
【出 处】
:
IUPAC 5th International Symposium on Novel Materials and the
【发表日期】
:
2009年12期
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