dual-erasure相关论文
Trapped Electron and Hole Distribution Mismatch Induced Reliability Degradation of SONOS Type Memory
为探究吕家坨井田地质构造格局,根据钻孔勘探资料,采用分形理论和趋势面分析方法,研究了井田7......
Trapped Electron and Hole Distribution Mismatch Induced Reliability Degradation of SONOS Type Memory
The reliability of silicon-oxide-nitride-oxide-silicon (SONOS) type memories was analyzed using the charge pumping metho......
