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一、前 言 随着国防科研的飞跃发展,纯钨中有害杂质元素的分析已成为我们日常检验中一项重要任务。测定纯钨中杂质元素方法很多,其中以光谱载体分馏法为主。实验证明,钨配样品中如果不加入载体而只与碳粉混合,则易挥发的钨酐在弧烧过程中转变为难挥发的WC和W_2C形式,同时被测杂质元素也能形成难挥发的碳化物,致使被测元素谱线强度极其微弱,所以必须选择合适的载体,使钨酐在弧烧过程中转变为难挥发的碳化物,
I. Introduction With the rapid development of national defense research, the analysis of harmful impurity elements in pure tungsten has become an important task in our daily inspection. Determination of pure tungsten impurity elements in many ways, of which the spectral carrier fractionation based. Experiments show that the sample with tungsten without adding a carrier but only mixed with the toner, the volatilized tungsten anhydride in the arc burning process into volatile forms of WC and W_2C, while the measured impurity elements can also form a volatile carbonization Material, resulting in the measured elemental spectral intensity is extremely weak, so we must choose the appropriate carrier, the tungsten anhydride in arc burning process into volatile carbides,