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滤光片波长是作为一些干涉仪上测量长度的标准,本文将简要地介绍适用于长度测量实验室条件的两种检定方法。这样就不必再把滤光片送到光学测量实验室用价格昂贵的分光光度仪器来检定。按本方法可以很方便地经常对乌氏接触干涉仪、干涉显微镜和平面干涉仪上用的滤光片波长进行核验,确保这些仪器的正确性。
The filter wavelength is used as a measure of the length of the measurement on some interferometers. This article will briefly introduce two test methods that are suitable for length measurement laboratory conditions. This eliminates the need to send filters to optical measurement laboratories for expensive spectrophotometers. According to this method, it is convenient to verify the wavelength of filter used on UBI contact interferometer, interference microscope and plane interferometer frequently to ensure the correctness of these instruments.