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电化学阻抗谱(EIS)是一种很有用的研究电化学性能的技术.理想的双电层电容器(EDLC)阻抗谱的尼奎斯特图由中高频的45°线和低频的与实轴垂直的直线组成,可以用孔径分布-传输线模型来解释.然而,在研究工作中还发现,在阻抗谱的高频区出现了半圆弧区域,为此,提出的等效模型认为半圆弧可以归因于活性材料之间的接触电阻和接触电容,以及电极与集流体之间的接触电阻与接触电容.还研究了充电过程、活性炭和电解液的电导率、导电添加剂和粘结剂的含量、隔膜、活性物质附载量和极片加压等因素对阻抗谱的影响.其中,充电截止电压、活性炭的电导率、导电添加剂的含量和极片加压对半圆弧部分影响较为显著.
Electrochemical Impedance Spectroscopy (EIS) is a useful technique for studying electrochemical performance. The ideal Nyquist plot of the impedance spectrum of an electric double layer capacitor (EDLC) consists of a mid-high 45 ° line and a low-frequency real axis Vertical line composition can be explained by the aperture distribution - transmission line model.However, in the research work, it is also found that the semi-circular arc region appeared in the high frequency region of the impedance spectrum. For this reason, the equivalent model proposed that the semi-circular arc Can be attributed to the contact resistance and the contact capacitance between the active materials and the contact resistance and the contact capacitance between the electrode and the current collector.The charging process, the conductivity of the activated carbon and the electrolyte, the conductivity of the conductive additive and the binder Content, separator, the amount of active material loaded and the pressure of the electrode on the impedance spectroscopy, etc. Among them, the charge cut-off voltage, the conductivity of the activated carbon, the content of the conductive additive and the pole piece pressure exert a significant influence on the semicircular arc part.