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采用高压方法制备了Ag偏离化学计量比的Ag1-xPb18SbTe20(x=0,0.3,0.6)样品,研究了Ag含量及温度对样品电学输运性能的影响。X射线衍射测试结果表明,样品具有单相NaCl结构,晶格常数随Ag含量的减少而变小。电学输运性能测试表明:与常规制备方法相比,高压方法制备的AgPb18SbTe20样品的电导率较高;样品电导率随x的增大而逐渐增大,x=0.6时,室温条件下的样品电导率高达1 598.4S/cm。随着温度的升高,Seebeck系数增大,电导率减小。300℃时,Ag0.4Pb18SbTe20样品的功率因子达到最大值,约为1.97mW/(m·K2)。
Ag1-xPb18SbTe20 (x = 0, 0.3, 0.6) samples with Ag deviating from the stoichiometric ratios were prepared by high-pressure method. The effects of Ag content and temperature on the electrical transport properties were investigated. X-ray diffraction results show that the sample has a single-phase NaCl structure, the lattice constant decreases with the decrease of Ag content. The results of electrical transport tests show that the conductivity of AgPb18SbTe20 samples prepared by high-pressure method is higher than that of conventional preparation methods. The conductivity of samples increases with the increase of x. At x = 0.6, the sample conductance at room temperature Rate up to 1 598.4S / cm. As the temperature increases, the Seebeck coefficient increases and the conductivity decreases. At 300 ℃, the power factor of Ag0.4Pb18SbTe20 sample reached the maximum, about 1.97mW / (m · K2).