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我们使用PHI595型扫描俄歇微探针(AES/SAM)[2]和PHI3500型二次离子质谱仪(SIMS)对酚醛-涤纶材料在星体使用前后的表面形态及杂质进行了测试。由于SIMS的检测灵敏度极高,AES又具有极好的空间分辨力,所以两者结合是一种很好的表面检测组合形式。它适合于各种宇航材料的物理化学性能测试,亦可对各种表面处理工艺进行鉴定。在测试酚醛-涤纶这样的绝缘体时,尽管在测试中会有电荷积累,但由于采用了消电荷措施仍能给出满意的测试结果。
We tested the surface morphology and impurities of phenolic-polyester materials before and after astral use with PHI595 Scanning Auger microprobe (AES / SAM) [2] and PHI 3500 Type Secondary Ion Mass Spectrometry (SIMS). Due to the high detection sensitivity of SIMS and the excellent spatial resolution of AES, the combination of the two is a good combination of surface detection. It is suitable for a variety of aerospace materials, physical and chemical performance testing, but also for a variety of surface treatment identification process. When testing phenolic-polyester insulators, satisfactory results can be obtained due to the elimination of charges despite the accumulation of charges during the test.