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石英在经受中等强度的冲击后其折光率和重折射率均明显下降,波状和镶嵌块状消光极发育,并出现独特的冲击微页理,这些微页理均发生在石英晶格的一些特定方位上。因此,用X射线单晶研究方法来鉴别石英单晶颗粒形变特征是最有效的方法之一。较早用X射线对受冲击石英进行研究的有赵景德,T.E.本奇(Bunch)和F.达切尔(Dachille)等人。赵景德利用德拜-席勒技术发现采自西德雷斯(Ries)陨石坑的一颗平均折光率为1.530的受冲击
The refractive index and refractive index of quartz decreased obviously after being subjected to medium-intensity impact, and the wave-like and mosaic massive extinction electrode developed and the unique impact micropatheses occurred. These micropatterns all occurred in some specific quartz crystal lattices On the position. Therefore, it is one of the most effective methods to identify the deformation characteristics of quartz single crystal by the X-ray single crystal research method. Earlier research on impacted quartz using X-rays included Zhao Jingde, T.E. Bunch and F. Dachille et al. Zhao Jingde Debye - Schiller discovered an average refractive index of 1.530 from the Ries craters