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光电器件(光电倍增管、光电二极管、太阳能电池等)的应用研究日益广泛,对其性能的测试要求也越来越高,尤其是对其核心部件光阴极光电转化量子效率(Quantum efficiency,QE)的测试和标定。通过建立的光阴极性能测试系统,开展了对各种型号光电器件阴极的测试研究。测试研究内容包括对光阴极在特定波长下QE的绝对测量和相对测量、对光阴极频谱响应特性的测量以及对光阴极面均匀性的扫描测试。目前对多种不同型号的光电二极管(Photo diode,PD)和光电倍增管(Photomultiplier tube,PMT)光阴极QE的测试结果显示,无论采用绝对测量或相对测量,其结果均与已有第三方标定结果一致;同时,搭建的二维扫描测试平台实现了对平面型光阴极均匀性的快速准确测试。
The research and application of optoelectronic devices (photomultipliers, photodiodes, solar cells, etc.) are becoming more and more widespread, and their performance requirements are also getting higher and higher, especially for its core components of the photoelectric conversion quantum efficiency (Quantum efficiency, QE) Test and calibration. Through the establishment of the cathode performance test system, conducted a variety of models of optoelectronic devices cathode test. The test research includes the absolute measurement and relative measurement of QE at a specific wavelength of the photocathode, the measurement of the spectral response of the photocathode, and the scanning test of the uniformity of the photocathode. At present, the test results of photo diode (PD) and photomultiplier tube (PMT) photocathode QE of many different types show that both the absolute measurement and the relative measurement have the same results as the existing third party calibration The result is consistent; meanwhile, the constructed two-dimensional scanning test platform realizes the fast and accurate test of planar photocathode uniformity.