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光路校正是光学仪器装配的关键,校正工艺的好坏与校正仪器的优劣直接影响着产品的质量和装配速度。过去的光路校正通常为光斑法和三圈观察法,存在着基准不合理、难统一、可检测位置少,以及这两种方法不易共用互补的缺点,光路校正难以达到预定要求。因此,寻求更好的校正方法和校正仪器已成为各光学仪器研究人员的迫切任务。
Optical path correction is the key to optical instrument assembly, the quality of the correction process and the quality of the correction instrument directly affect the quality of the product and assembly speed. In the past, the correction of the optical path is usually the spot method and the three-circle observation method. There are some shortcomings such as the unreasonable standard, ununiformity and few detectable positions, and the difficulty of the two methods in achieving mutual complementarity. The optical path correction can not meet the predetermined requirements. Therefore, to find better correction methods and calibration instruments has become an urgent task for optical instrument researchers.