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半导体温度系数检定箱是用来测定仪器元件因温度变化1℃所引起的物理量变化,以判断该仪器元件是否符合精度要求,并确定其修正值的设备。该设备为气象计量工作检定膜盒式气压表(高度表)和气压自记仪器设计的。半导体温度系数检定箱经一年多使用,性能稳定可靠,操作方便,技术参数完全符合规程要求。一、基本原理: 半导体温度系数检定箱采用半导体元件致冷方式,其原理是根据珀尔帖(Peltier)效应:N型和P型半导体组成电偶对,在电偶对中接
Semiconductor temperature coefficient test box is used to determine the temperature changes caused by the instrument components 1 ℃ caused by changes in the physical quantity to determine the accuracy of the instrument components meet the requirements and determine the correct value of the equipment. The device is designed for metrological verification of capsule gauges (altimeter) and pneumatic self-recording instruments. Semiconductor temperature coefficient test box for more than a year to use, stable and reliable performance, easy to operate, the technical parameters in full compliance with the rules and requirements. First, the basic principle: Semiconductor temperature coefficient test box using semiconductor components cooling method, the principle is based on the Peltier effect (Peltier) effect: N-type and P-type semiconductor composed of galvanic couple, the galvanic couple