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在本刊1980年第四期,我们曾对FU—60Z电子管玻壳穿洞问题进行过初步分析。本文将进一步深入讨论这个问题,提出几种预防措施,并着重讨论在阳极法兰盘上加装“挡板”的作用。前文曾介绍过:发射管玻壳穿洞的主要原因是由于高频介质损耗引起玻璃局部过热,使玻璃软化,产生吸入(即穿洞)。玻璃的介质损
In the fourth issue of 1980, we conducted a preliminary analysis of the problem of the bulb hole of the FU-60Z tube. This article will delve further into this issue, proposing several precautions and focusing on the addition of a “baffle” to the anode flange. Earlier, it was introduced that the main reason for the bulging of the launch tube bulb is the local overheating of the glass due to high-frequency dielectric loss, which softens the glass and creates inhalation (ie, piercing). The dielectric loss of glass