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提出后栅型场发射显示器(FED)测试过程中的窜压现象,解释该现象的产生原因。阴极电极侧壁场发射电子轰击栅极导致电压表示数发生变化。针对此问题设计一种具有沟槽状介质层结构的后栅型FED从而避免阴极电极侧壁的电子发射。采用全印刷技术制作场发射显示阵列。实验表明此器件具有良好的发射稳定性及栅压调控特性,有效杜绝窜压现象的发生。阳极电压为600 V,栅极电压在100~250 V范围内对阳极电流有良好的调控作用。
The phenomenon of channeling during the test of the back gate field emission display (FED) was put forward to explain the cause of this phenomenon. The field emission electrons on the cathode electrode sidewall bombard the gate causing the voltage representation to change. In response to this problem, a back gate type FED with a trench dielectric layer structure is designed to avoid the electron emission from the cathode electrode sidewall. Using all-printing technology to produce field emission display array. Experiments show that the device has good emission stability and gate voltage regulation characteristics, effectively eliminate the occurrence of channeling phenomenon. Anode voltage of 600 V, the gate voltage in the range of 100 ~ 250 V anode current has a good regulatory role.