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我国发光二极管(LED)的生产,当前存在两个迫待解决的问题;1) 效率低,2) 寿命短。本文在大量分析国内外生产的LED的基础上,阐述了结区缺陷的种类及其对光电恃性的影响。内容包括1.LED结区缺陷的观察2.在位错、孪晶等晶体缺陷处无辐射复合的直接判据3.位错对LED发光效率与寿命的影响4.LED的老化特点5.位错对LED伏-安特性的影响结论:缺陷密度大是当前国产LED效率低、寿命短的关键。
There are currently two problems to be solved in the production of light-emitting diode (LED) in our country; 1) low efficiency, 2) short life span. Based on a great deal of analysis of LED produced domestically and abroad, this paper expounds the types of defects in junction area and their influence on photoelectricity. Including 1. LED junction defect observation 2. In dislocations, twins and other crystal defects at no direct radiation composite criteria 3. Dislocation of the LED luminous efficiency and life expectancy 4.LED aging characteristics 5. Bit The effect of the fault on the LED volt-ampere characteristics Conclusion: The large defect density is the key to the low efficiency and short life span of domestic LED.