Degradation of light emitting diodes:a proposed methodology

• 作 者: Sau Koh Willem Van Driel G.Q.Zhang
• 机 构: Delft Institute of Microsystems and Nanoelectronics(Dimes) Delft University of Technology,Materials
• 出 处: 半导体学报
• 发表日期: 2011年01期
• 关键词: LED light degradation lumen overstress current temperature

Due to their long lifetime and high efficacy,light emitting diodes have the potential to revolutionize the illumination industry.However,self heat and high environmental temperature which will lead to increased junction temperature and degradation due to electrical overstress can shorten the life of the light emitting diode.In this research,a methodology to investigate the degradation of the LED emitter has been proposed.The epoxy lens of the emitter can be modelled using simplified Eyring methods whereas an equation has been proposed for describing the degradation of the LED emitters.

Due to their long lifetime and high efficacy, light emitting diodes have the potential to revolutionize the illumination industry. Host, self heat and high environmental temperature which will lead to increased junction temperature and degradation due to electrical overstress can shorten the life of the light emitting In this research, a methodology to investigate the degradation of the LED emitter has been proposed. The epoxy lens of the emitter can be modelled using simplified Eyring methods. an an equation has been proposed for describing the degradation of the LED emitters.