论文部分内容阅读
1.引言基本参数法和经验系数法(或影响系数法、α系数法等)是X射线荧光分析中数学校正法的两大分支。但在实践中它们都不是完美无缺的。“纯”基本参数法涉及到一系列物理参数和分析系统中其它一些因素的不确定性的影响。从经验途径求出的α系数通常也只适用于某一有限的组分变化范围,即α系数本身也是样品组成的函数。而且用多标样回归算出的α系数对测量误差极为敏感,当缺乏足够的标样时这种方法就有很大的局限性。
1. Introduction The basic parameter method and the empirical coefficient method (or the influence coefficient method, alpha coefficient method, etc.) are the two major branches of the mathematical correction method in X-ray fluorescence analysis. But in practice they are not perfect. The “pure” basic parameter approach involves a series of physical parameters and the impact of uncertainty in other factors in the analysis system. The alpha coefficient obtained empirically also applies only to a limited range of compositional variation, ie the alpha coefficient itself is also a function of sample composition. Moreover, the α coefficient calculated by multiple standard regression is very sensitive to the measurement error. This method has a great limitation in the absence of enough standard samples.