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In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope(OM) combined with a nanopipette-based quartz tuning fork atomic force microscope(nanopipette/QTF-AFM) system. This system is used to accurately determine substrate position and nanoscale phenomena under ambient conditions. Solutions consisting of 5 nm Au nanoparticles, nanowires, and polydimethylsiloxane(PDMS) are deposited onto the substrate through the nano/microaperture of a pulled pipette. Nano/microscale patterning is performed using a nanopipette/QTF-AFM, while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization(force spectroscopy/microscopy) using the quartz tuning fork(QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface, and on-demand delivery and patterning of various solutions for molecular architecture.
In this work, we introduce position-resolved surface characterization and nanofabrication using an optical microscope (OM) combined with a nanopipette-based quartz tuning fork atomic force microscope (nanopipette / QTF-AFM) system. Nano / micro scale patterning is performed using a nanopipette / QTF-AFM (PDMS) , while position is resolved by monitoring the substrate with a custom OM. With this tool, one can perform surface characterization (force spectroscopy / microscopy) using the quartz tuning fork (QTF) sensor. Nanofabrication is achieved by accurately positioning target materials on the surface , and on-demand delivery and patterning of various solutions for molecular architecture.