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The X-ray spectra induced by the highly charged xenon and argon ions impinging on a tantalum surface are reported. The experiment was done at the ECR ion source of H1RFL. It is found that the yield of the tantalum M-X rays increases intensively as the projectile kinetic energy increasing. Moreover, the tantalum M-X ray induced by the xenon ions is higher in energy and broader in width than that induced by the argon ions (as shown in Figs. 1 and 2).
The X-ray spectra induced by the highly charged xenon and argon ions impinging on a tantalum surface are reported. The experiment was done at the ECR ion source of H1RFL. It is found that the yield of the tantalum MX rays increases intensively as the projectile kinetic energy increasing. Moreover, the tantalum MX ray induced by xenon ions is higher in energy and broader than width induced by the argon ions (as shown in Figs. 1 and 2).