Toward one nanometer X-ray focusing: a complex refractive lens design

• 作 者: 陈直 谢红兰 邓彪 杜国浩 江怀东 肖体乔
• 机 构: Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics,Chinese Academy of Sc
• 出 处: Chinese Optics Letters
• 发表日期: 2014年12期
• 关键词: nanometer focusing refractive aperture FWHM capable matched remaining outer dime

We report a design for one nanometer X-ray focusing by a complex refractive lens, which is capable of focusing 20 ke V X-rays down to a lateral size of 0.92 nm(full-width at half-maximum(FWHM)) and an axial size of 98 nm(FWHM) with intensity gain of 49050. This complex refractive lens is comprised of a series of kinoform lenses, whose aperture is gradually matched to the converging trace of the X-ray beam so as to increase the numerical aperture(NA). The theoretical principle of the proposed complex refractive lens is presented. The NAs of these lenses are calculated. The numerical simulation results demonstrate that the proposed design can focus the X-ray beam into sub-nanometer while remaining high gain.

We report a design for one nanometer X-ray focusing by a complex refractive lens, which is capable of focusing 20 ke V X-rays down to a lateral size of 0.92 nm (full-width at half-maximum (FWHM)) and an axial size of 98 nm (FWHM) with intensity gain of 49050. This complex refractive lens is comprised of a series of kinoform lenses, whose aperture is gradually matched to the converging trace of the X-ray beam so as to increase the numerical aperture The theoretical principle of the proposed complex refractive lens is presented. The numerical simulation results demonstrate that the proposed design can focus the X-ray beam into sub-nanometer while remaining high gain.