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本文首先介绍了用DJS—061—1(或MEK6800D_2)微型计算机测试各种LSI电路的原理和方法。进而介绍了运用DJS—061—1机的并行接口PIA—B组成通用测试接口,直接对DJS—061机的MPU分片电路、PIA接口、EPROM、ROM、RAM等多种LSI进行测试的有关技术。本文的后一部分介绍了用DJS—061—1型(或MEK6800D_2型)微型计算机为控制机组成一个小的LSI芯片测试系统的有关技术,包括LSI芯片测试的保护与隔离、探针不良的计算机辅助诊断和LSI常见工艺缺陷的计算机辅助分析。此外还介绍了运用DJS—061—1(或MEK6800D_2)组成全自动LSI芯片测试系统的设计技术。
This article first introduces the principle and method of testing various LSI circuits with the DJS-061-1 (or MEK6800D_2) microcomputer. Furthermore, we introduce the technology of testing multi-LSI of DJS-061 machine, such as MPU chip circuit, PIA interface, EPROM, ROM, RAM and so on, by using the parallel interface PIA-B of DJS- . The latter part of this article describes the techniques used to build a small LSI chip test system with DJS-061-1 (or MEK6800D_2) microcontrollers, including LSI chip test protection and isolation, poor probe computer assistance Computer Aided Analysis of Diagnostics and Common Process Defects in LSI. Also introduced the use of DJS-061-1 (or MEK6800D_2) composed of fully automated LSI chip test system design techniques.