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在运算放大器输入失调电压(V_(10))的测试中,传统测试设备采用“被测器件-辅助运放”的模式,籍以构成稳定的负反馈网络,从而使DUT的输出电压嵌位于预置电压,而ASL-1000通过独创的电位平衡电路和相位补偿电路同样实现了DUT的输出嵌位,完成了由间接测试向直接测试的转化。针对V_(10)已经失效的芯片,提出了利用ASL-1000现有的硬件资源,在软件上加严判据的失效筛选方法,作为Credence方案的补充。
In the test of the op amp input offset voltage (V_ (10)), the traditional test equipment adopts the mode of “DUT - AOC” to form a stable negative feedback network so that the output voltage of the DUT is embedded in the pre Set voltage, and ASL-1000 through the original potential equalization circuit and phase compensation circuit to achieve the same output DUT embedded, completed by the indirect test to direct conversion test. Aiming at the chips that V_ (10) has failed, this paper presents a new method of using the existing hardware resources of ASL-1000 and tightening the software on the failure screening method, which complements Credence’s scheme.