论文部分内容阅读
给出一个干涉系统等效平面和被测平面形貌的数学模型,用于分离仪器的系统误差,以提高面形和长度测量的精度。
A mathematical model that interferes with the equivalent plane of the system and the measured plane topography is given to separate the system error of the instrument and improve the accuracy of the surface shape and length measurement.