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本文叙述了简易低温样品室的设计原理、结构性能和它在电阻(R)—温度(T)测试仪中的应用。在Ni Ti形状记忆合金相变规律的研究中,测试和分析了该合金的二种典型的电阻(R)—温度(T)曲线。
This article describes the design principle, structural performance, and its application to a resistance (R) -temperature (T) tester for a simple low-temperature sample cell. In the study of the phase transformation of Ni Ti shape memory alloys, two typical resistance (R) -temperature (T) curves of the alloy were tested and analyzed.