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膜厚是微胶囊重要性能之一,直接影响芯料释放速率,较为难测。本文提出一种测定膜厚的新方法——光学显微镜二次聚焦法,即用光学显微镜二次聚焦直接测出微胶囊内、外径而得膜厚。计算发现微胶囊等光程曲线连续而不光滑(即有拐点),从光学原理上证明此法可行;观察二次聚焦的光学显微图象,发现存在贝克线、从实验结果上间接证明此法可行;此法测定的膜厚与经典法测定的膜厚相比,结果基本一致,证实此法准确。在上述理论基础上,采用相分离法制备一系列不同工艺的微胶囊,分别测出膜厚及芯料释放速率,从而揭示微胶囊膜厚对芯料释放速率的影响规律。
Film thickness is one of the important properties of microcapsules, a direct impact on the core material release rate, more unpredictable. This paper presents a new method for the determination of film thickness - optical microscopy secondary focusing method, which uses optical microscopy secondary focus directly measured inside and outside the microcapsules derived film thickness. The results show that the optical curve of microcapsules is continuous but not smooth (that is, inflexion point), and the optical principle proves that this method is feasible. Observe the optical microscopic images of secondary focusing and find the Baker line, and indirectly prove this from the experimental results Method is feasible; the film thickness measured by this method compared with the film thickness determined by the classic method, the results are basically the same, confirmed this method is accurate. Based on the above theories, a series of microcapsules with different processes were prepared by phase separation method, and the film thickness and the release rate of the core material were respectively measured to reveal the influence of microcapsule film thickness on the release rate of the core material.