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人们知道,在ZnS(Cu,Mn,Cl)薄膜夹层式场致发光元件中,每当改变外加电压方向时,就产生一“形成”过程(formingprocess),不过,对形成过程的具体机理还不完全了解。目前我们提出了SnO_2—ZnS (Cu,Mn,Cl)—Al二极管的Ⅰ—Ⅴ特性曲线,它与伴有场致发光的极化记忆二极管的开关过程有关。最近Hamakawa等人报导了SnO_2—ZnS—Au二极管,有类似的
It is known that in a ZnS (Cu, Mn, Cl) thin-film type interlayer electroluminescent device, a “forming process” occurs every time the direction of the applied voltage is changed. However, the specific mechanism of the formation process is not yet known Fully understand. At present, we propose the Ⅰ-Ⅴ characteristic curve of SnO_2-ZnS (Cu, Mn, Cl) -Al diodes, which is related to the switching process of the polarizing memory diode with electroluminescence. Recently Hamakawa et al. Reported SnO 2 -ZnS-Au diodes, which are similar