Nonionizing energy loss(NIEL) has been applied to a number of studies concerning displacement damage effects in materials and devices. However, most studies con
This paper presents an exact expression for switch-induced error voltage which would cause a spike voltage on the output capacitor of the automatic conversion m
In the fabrication of a 48 mm×48 mm silicon micro-strip nuclear radiation detector with 96 strips on each side, a perfect P-N junction cannot be formed consist
A new high-voltage LDMOS with linearly-distanced fixed charge islands is proposed(LFI LDMOS).A lot of linearly-distanced fixed charge islands are introduced by