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1 引言微电子技术的发展,给测试领域带来新的挑战。一方面是VLSI芯片集成的功能越来越多,所含电路的复杂性指数函数增长。象i860微处理器芯片,内部既有控制部件、运算部件,又有RAM、三维图形部件及接口部件,芯片内集成上百万个晶体管,引出管脚达168。另一方面,芯片对用户越来越不透明。早期的集成电路门数较少,对它的说明及描述相当清晰,生成其功能测试代码不成问题。但随着功能的复杂、门数的增多,对其描述也越来越简单,停留在逻辑框图级或者指令级。如果在电路的工作系统中用实装测试法检验其正确性还较易实现,而要在测试系统中用测试码对其功能进行一一测试就比较困难了。
1 Introduction The development of microelectronic technology brings new challenges to the field of testing. The one hand, VLSI chip integration functions more and more, the complexity of the circuit contains the exponential function. Like i860 microprocessor chip, both internal control components, computing components, but also RAM, three-dimensional graphics components and interface components, the chip integrates millions of transistors, leads up to 168 pins. On the other hand, chips are becoming more and more opaque to users. Early gate less integrated circuit, its description and description is quite clear, to generate its functional test code is not a problem. However, with the complexity of functions and the increase of the number of gates, its description is getting more and more simple, staying at the level of the logic block diagram or the instruction level. If the circuit in the working system with the actual test method to verify the correctness of the more easy to achieve, but in the test system to test the function of the test code to test one by one more difficult.