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本文提出了一种新的方法和综合技术用来去除多扫描链内建测试中由线形反馈移位寄存器引起的测试向量线性关联性。利用本方法可以高效的设计内建自测试中移位器并且保证足够扫描链间的位移和每条扫描通道尽少量的门数开销。
In this paper, a new method and synthesis technique is proposed to remove the linear correlation of test vectors caused by the linear feedback shift register in the built-in multi-scan chain test. With this method, it is possible to efficiently design a built-in self-test shifter and ensure sufficient displacement between scan chains and a minimal gate count per scan channel.