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The electron-induced L-shell X-ray par- tial production cross sections, total production cross sections and mean ionization cross sections for Ho and Os have been measured as functions of electron energies from near threshold up to 36 keV by using a thin target with thick substrate technique. The influ- ence of the electrons reflected from the substrate was corrected by using the electron transport biparti- tion model. Also, the corrected measured results were compared with theoretical predictions proposed by Gryzinski and McGuire.
The electron-induced L-shell X-ray par- tial production cross sections, total production cross sections and mean ionization cross sections for Ho and Os have been measured as functions of electron energies from near threshold up to 36 keV by using a thin target with thick substrate technique. The influ- ence of the electrons reflected from the substrate was corrected by using the electron transport biparti- tion model. Also, the corrected measured results were compared with theoretical predictions proposed by Gryzinski and McGuire.