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用透射光谱法和光热偏转谱法测得了C_(60)和C_(70)薄膜在宽能量范围(0.6到6.5 eV)的光谱,并计算了吸收系数.根据分子轨道模型分析了C_(60)和C_(70)薄膜的光跃迁行为.Fuller烯薄膜的弱吸收光谱与非晶硅的类似.用Tauc公式确定了C_(60)和C_(70)薄膜的光学带隙分别为1.75和1.65eV.Urbach吸收边和亚隙吸收表明Fuller烯薄膜中存在无序状态,导致带尾态和缺陷态,这虽非C_(60)或C_(70)薄膜所固有,但无序的存在给准确测定Fuller烯薄膜的禁带宽度带来障碍.讨论了偏转介质与衬底对Fuller烯薄膜的弱吸收光谱的影响.
The spectra of C_ (60) and C_ (70) films in a wide range of energy (0.6 to 6.5 eV) were measured by transmission and photothermal methods and their absorption coefficients were calculated. According to the molecular orbital model, ) And C 70 thin films.The weak absorption spectra of Fuller enamel films are similar to those of amorphous silicon.The optical band gaps of C 60 and C 70 films were determined to be 1.75 and 1.65 The absorption edge and interstitial absorption of eV.Urbach indicate that there are disorder states in the Fuller olefin films, leading to band tail states and defect states. Although not intrinsic to the C_ (60) or C_ (70) films, the presence of disorder It is difficult to determine the band gap of Fuller olefin film.The influence of the deflection medium and substrate on the weak absorption spectra of Fuller enamel film is discussed.