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I_(DDQ)测试是当前倍受国内外业界人士关注的一种新的CMOS集成电路测试方法和技术。这种测试是在多种输入逻辑条件下测试CMOS电路的静态电源电流参数值,它可以有效地检测出早期失效器件。I_(DDQ)测试的关键技术是测试向量自动生成及高效的测试实现技术。围绕这两大课题,本文提出了一种基于ITS9000测试系统的功能I_(DDQ)测试方法和技术,并在ITS9000上进行了测试试验。实践表明,这种功能I_(DDQ)测试方法,可以自动生成测试向量集和测试程序,测试效率高,测量结果精确,测试操作简便易行。
The I_ (DDQ) test is currently a new CMOS integrated circuit test method and technology that is of great concern to people in the industry at home and abroad. This test is to test CMOS circuit static power supply current parameter values under a variety of input logic conditions, it can effectively detect the early failure of the device. The key techniques of I_ (DDQ) testing are automatic generation of test vectors and efficient test implementation techniques. Focusing on these two topics, this paper presents a functional I_ (DDQ) testing method and technology based on the ITS9000 test system, and tests it on the ITS9000. Practice shows that this function I_ (DDQ) test method can automatically generate test vector sets and test procedures, test efficiency, accurate measurement results, test operation is simple and easy.