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本文将电子探针定量分析中的一个厚块状样品的校正程序,扩展为微粒样品的校正程序。修改后的程序,不但仍可用于厚块状样品的校正,而且对不同直径的微粒样品也可进行校正计算。文中比较了几种不同的校正程序对微粒样品的校正计算结果。直径1-4μm的硫化铁微粒和直径0.4-4μm的五元钴基合金微粒,采用本文提示的程序,其校正精确度分别优于4％和10％,说明修改后的程序对微粒样品的校正是合适的。
In this paper, the calibration procedure of a thick block sample in electronic probe quantitative analysis is extended to the calibration procedure of the particle sample. The revised program can not only be used for thick block sample calibration, but also for different diameters of the particle samples can also be corrected. In this paper, several different calibration procedures for the calibration of particle samples are compared. Iron sulfide particles of 1 to 4 μm in diameter and pentagonal cobalt-based alloy particles of 0.4 to 4 μm in diameter were corrected using the procedure presented herein with a precision of better than 4% and 10%, respectively, indicating that the modified program corrects the particle sample Is suitable.