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利用同步辐射XAFS(X-ray AbsorptionFine Structure)实验及FEFF计算进行数据拟合,研究遗态转化工艺制备的ZnO产物的微观晶体结构参数。研究结果表明,遗态转化工艺得到了ZnO产物,木材结构分级多孔ZnO产物的第一壳层Zn-O距离为0.1986nm,第二壳层Zn-Zn距离为0.3240nm。根据得到的配位壳层Debye-Waller因子较小(ss1=0.00346,ss=0.00780)得出ZnO产物具有较好的有序晶体结构,同时表明在ZnO中,Zn原子第一近邻壳层的O原子有序程度高于其它次近邻壳层原子。
The X-ray Absorption Fine Structure (XAFS) experiment and FEFF calculation were used to fit the data to study the microscopic crystal structure parameters of ZnO products prepared by the process of conversion from legacy. The results show that the ZnO product is obtained from the process of conversion of hereditary state. The distance Zn-O between the first shell and the second shell Zn-O is 0.1986nm and 0.3240nm respectively. According to the smaller Debye-Waller factor of the coordination shell (ss1 = 0.00346, ss = 0.00780), the ZnO product has better ordered crystal structure and shows that in the ZnO, The degree of atomic order is higher than that of other nearby sub-shell atoms.