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背散射电子衍射装置在扫描电镜中用于研究大块样品中各种大小晶粒的晶体结构和晶粒间的取向关系。这一技术扩展了扫描电镜的应用范围,是八十年代末兴起的一种新技术,用该技术可以做以下几方面的工作:1)测量研究晶体材料的晶体结构,测量晶粒的取向和晶粒间的取向关系;2)研究晶体
The backscattered electron diffraction device was used to study the crystal structure and intergranular orientation of various sizes of grains in bulk samples in scanning electron microscopy. This technology expands the scope of application of SEM and is a new technology emerging in the late 1980s. It can do the following work: 1) Measure the crystal structure of crystal materials, measure the orientation of crystal grains and Orientation relationship between grains; 2) Study of crystals