Electron spectroscopies and their use for materials characterization

• 作 者: Didier SBILLEAU
• 机 构: Laboratoire PALMS,UMR CNRS-Universite 6627,Bat.11C,Universite de Rennes-1 35042 Rennes-Cedex,France
• 出 处: Nuclear Science and Techniques
• 发表日期: 2003年01期
• 关键词: Electron explained struc LEED overview critically trapped excited instance annea

We present here a general overview of electron spectroscopies from a practical point of view. The most frequently used ones are described and the type of structural information they can provide on materials is explained in relation to the physical processes on which they are based. Furthermore, we explore critically and in detail various tools that have been developed to allow a systematic solving of structures by these spectroscopies.

We present here a general overview of electron spectroscopies from a practical point of view. The most frequently used ones are described and the type of structural information they can provide on materials is explained in relation to the physical processes on which they are based. Furthermore, we explore critically and in detail various tools that have been developed to allow a systematic solving of structures by these spectroscopies.