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附录线性反馈移位寄存器(LFSR)理论由于线性反馈移位寄存器在结构上简单而且相当规则,其移位性质容易与串行扫描结合起来,而且能够生成穷举和/或伪随机测试向量,所以在BIST中广泛应用。LFSR的典型元件是D触发器和XOR(异或)门。这里只涉及LFSR作为测试生成器和响应分析器时的性质。图A列出了两个典型LFSR。两者都用D触发器和线性逻辑元件(XOR门)。它们的基本区别是图A1电路在触发器之间用XOR而图
Appendix Linear Feedback Shift Register (LFSR) Theory Since linear feedback shift registers are structurally simple and fairly regular, their shift properties are easy to combine with serial scans and can generate exhaustive and / or pseudo-random test vectors, so Widely used in BIST. Typical components of LFSR are D flip-flops and XOR gates. Here only the nature of the LFSR as a test generator and response analyzer. Figure A lists two typical LFSRs. Both use D flip-flops and linear logic elements (XOR gates). The basic difference between them is that the circuit in Figure A1 uses XORs between flip-flops