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Veeco仪器公司为XRF-300 x射线荧光表面测量系统配上一台单独的IBM-AT兼容式个人计算机,以提高该仪器的测试速度和分析能力。这套系统能测量任何镀层的厚度,包括任何基体上的多层涂复。还能同时测量电子和电镀领域中使用的合金的厚度和成分。并且,也能精确测定电解液中金属元素的浓度。 XRF-300 x射线荧光表面测量系统内在的处理能力已由外接的AT型计算机来完成。其鼠标器一驱动,多窗口—基本软件,借助于列出的菜单在MSDOS下操作,能提供先进的光谱分析。计算机的随机存取存贮器(RAM)为1兆字节,并具有40兆字节的
Veeco Instruments equips the XRF-300 x-ray fluorescence surface measurement system with a single IBM-AT compatible personal computer to increase the speed and analytical capabilities of the instrument. The system measures the thickness of any coating, including multi-layer coating on any substrate. It also measures the thickness and composition of the alloys used in the electronics and electroplating fields. Also, the concentration of metal elements in the electrolyte can be accurately measured. The inherent processing power of the XRF-300 x-ray fluorescence surface measurement system has been achieved with an external AT-type computer. With its mouse-driven, multi-window - basic software, it operates under MSDOS with the help of the listed menus to provide advanced spectral analysis. The computer’s random access memory (RAM) is 1 megabyte and has 40 megabytes